System and Method for Determining One or More Properties of an Object

Abstract

Systems and methods for determining properties of an object are disclosed. A system includes a gripping element and at least one waveguide coupled to the gripping element. The waveguide is configured to transport a light signal through the gripping element and to transmit the light signal, at least a portion of the light signal illuminating the object. A detector is configured to detect at least a portion of the light signal and sense a curvature of the gripping element. A probe element coupled to the gripping element is configured to collect light reflected from the object. A spectrometer is configured to generate spectral data using the reflected light collected. A processor is configured to calibrate the spectral data based on the curvature and to determine properties of the object based on the curvature and the spectral data. The system enables recognition and profiling of objects based on spectroscopy and curvature.

Publication
US Patent Application 2025/0208032 A1
Nathaniel Hanson
Nathaniel Hanson
Ph.D. Alumnus, MIT Lincoln Laboratory
Taskin Padir
Taskin Padir
Professor, Principal Investigator
Austin Allison
Austin Allison
PhD Student